Download A gallery of Chua attractors by Eleanora Bilotta, Pietro Pantano PDF

By Eleanora Bilotta, Pietro Pantano

Chaos is taken into account as some of the most vital ideas in sleek technology. It initially seemed simply in computing device simulation (the recognized Lorenz equation of 1963), yet this replaced with the creation of Chua s oscillator (1986) -- an easy digital circuit having the ability to generate an enormous diversity of chaotic behaviors. With Chua s circuit, chaos turned a actual phenomenon, quite simply understood and represented in mathematical language. but, however, it's nonetheless tricky for the non-specialist to understand the total number of behaviors that the process can produce.

This e-book goals to bridge the distance. A gallery of approximately 900 chaotic attractors -- a few generated by means of Chua s actual circuit, the bulk via laptop simulation of the circuit and its generalizations -- are illustrated as 3D colour photos, time sequence and speedy Fourier rework algorithms. For researchers, additionally awarded is the knowledge essential to mirror the behaviors and photographs. ultimately, how the fractal richness should be plied to inventive results in producing song and engaging sounds is proven; a few examples are integrated within the DVD-ROM which comes with the e-book.

Contents: Chua s Oscillator and Its Generations; The actual Circuit; Dimensionless Equations; The Cubic functionality; Single-Scroll structures; Multiscrolls structures.

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These hot or energetic electrons are generated by the channel hot holes via interband generation of electron-hole pairs, commonly known as the hot carrier effects (but among many hot carrier effects), which alters the conduction characteristics of the pMOST. Erase is performed by recovering the current-voltage characteristics of the written floating-gate pMOST via the removal of the stored charges (electrons) from the insulated floating gate either through electrical tunneling or UV light exposure.

5V NW Fig. 3V logic circuit manufacturing process node. Fig. 4 Channel hot-hole generated hot electron injection into the floating gate. 4 Erase Mechanism To erase a NeoBit cell, exposure to ultraviolet (UV) light is employed. When a NeoBit cell is exposed to high-energy photons from UV light, electrons stored in the floating gate are excited, and gain sufficient kinetic energy to get emitted out of the floating gate. Then the NeoBit cell is returned to the erase state and its memory transistor’s channel conduction current pathway is cut off.

Vg stress for Area=1‫כ‬104 2 µm (nMOST). 01% TTF vs. Vg stress for Area=1‫כ‬10 2 µm (pMOST). 01% lifetime vs. 7V 100K stress for 4 2 Area=1‫כ‬10 µm . 5V pMOST area vs. 1% lifetime. NeoFlash PGM Ion_min vs. cycling count (25°C and 85°C). PGM Ion_min (uA) vs. baking time (hrs) at 3 temperatures. Weibull plot of data retention at 3 temperatures (30 samples/curve). Arrhenius plot of NeoFlash SONOS device. Cell array layout. Cell array schematic. xxix 112 113 114 115 115 118 119 119 119 120 120 121 122 122 124 124 125 126 127 127 129 130 132 133 134 136 136 137 138 139 141 141 142 144 145 xxx Logic Non-Volatile Memory CharlesChing-Hsiang Ching-HsiangHsu, Hsu,Yuan-Tai Yuan-TaiLin, Lin,Evans EvansChing-Sung Ching-SungYang, Yang,Rick RickShih-Jye Shih-JyeShen Shen bybyCharles Fig.

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